Enhanced Charge Transfer Efficiency Using Ring Vertical Transfer Gates in Backside Illuminated CMOS Image Sensor
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DOI: 10.1109/vlsitsa60681.2024.10546447
文献链接: https://ieeexplore.ieee.org/document/10546447/
其他信息:
出版社: IEEE
作者: Yu-Chieh Lee; Avishek Das; Yi Huang; Logeshwaran Venkatesapandian; C. W. Liu