The Response Frequency of Interface Traps Using a Dual-Frequency Charge-Pumping Method and Its Correlation With 1/f Noise
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DOI: 10.1109/jeds.2025.3593374
文献链接: https://ieeexplore.ieee.org/document/11098707/
其他信息:
出版社: Institute of Electrical and Electronics Engineers (IEEE)
作者: Yi Jiang; Luping Wang; Kai Chen; Rui Su; Luyu Yang; Dawei Gao; Junkang Li; Ran Cheng; Rui Zhang
