The Response Frequency of Interface Traps Using a Dual-Frequency Charge-Pumping Method and Its Correlation With 1/f Noise
用户ydeigrG4DijY
2小时前
9
10
求助中
帖子自动结束时间: 2025-08-19 19:55:13
1. 文件大小不能超过300M, 允许上传文档或压缩包等
2. 请确保上传文献的真实性、完整性,不得对原文做任何修改
注: 所有应助的资源仅供学习交流使用, 不得违反相关法律法规
DOI: 10.1109/jeds.2025.3593374
文献链接: https://ieeexplore.ieee.org/document/11098707/
其他信息:
出版社: Institute of Electrical and Electronics Engineers (IEEE)
作者: Yi Jiang; Luping Wang; Kai Chen; Rui Su; Luyu Yang; Dawei Gao; Junkang Li; Ran Cheng; Rui Zhang